Manufacturer:KLA Corporation
Model:KLA 5105
Type:Advanced Inspection Module
Application:Semiconductor Wafer Inspection
Detection Capability:Sub-50nm Defects
Resolution:High Resolution Imaging
Software:Integrated Inspection Software Suite
Inspection Rate:Up to 200 wafers per hour
Dimensions:Width: 60cm, Height: 120cm, Depth: 80cm
Weight:Approximately 500kg
Power Requirements:220V AC, 50/60Hz
Operating Environment:Temperature: 18°C to 25°C, Humidity: 20% to 80%
The KLA KLA 5105 is meticulously engineered for precision measurement in semiconductor manufacturing environments. Its high accuracy and repeatability make it ideal for critical inspection tasks, ensuring consistent quality control.
This measurement module is equipped with advanced sensors that provide reliable and precise measurements, even under challenging conditions. It is designed to integrate seamlessly into existing semiconductor manufacturing systems, enhancing overall productivity.
The compact design of the KLA KLA 5105 allows for easy installation and maintenance, minimizing downtime and maximizing operational efficiency. Its robust construction ensures durability and long-term reliability, making it a valuable asset in any production line.
With its user-friendly interface and comprehensive documentation, the KLA KLA 5105 is easy to operate and maintain. Our dedicated technical support team is always available to assist with any questions or concerns, ensuring optimal performance.
Upgrade your semiconductor inspection process with the KLA KLA 5105. Experience unmatched precision, reliability, and ease of use, leading to higher quality products and increased profitability.
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